Quantification of flatness and noise errors Sample Clauses

Quantification of flatness and noise errors. The flatness error of an instrument is the planarity deviation when measuring a perfect plane. The effect of the flatness error of the white light confocal profilometer on surface topography measurement can be assessed by examining the waviness of the measured surface of a perfect plane, as seen in Section (c) of Figure 11 below. Noise error is unwanted data affecting the resolution of the measurement system. Noise error can result from external environmental sources (e.g. lack of cleanliness; draughts; temperature gradients and vibrations) or from internal equipment sources (e.g. machine defects, electronic noise or quantisation) (BIPM et al., 2008). The effect of the noise error of the white light confocal profilometer noise can be assessed by examining the roughness of the measured surface of a perfect plane, as seen in Section (d) of Figure 11 below.