Test Chip definition

Test Chip means a device which complies with the test chip specification set forth in Schedule 2 Part A Item D1.
Test Chip means for [***]
Test Chip means for each ARM Compliant Core a device which complies with the relevant Test Chip Documentation.

Examples of Test Chip in a sentence

  • In the event that any Test Chip fails the process, ARM shall provide details of the errors that cause the failure to LICENSEE and LICENSEE shall endeavour to correct the errors.

  • In the event that ARM fails to confirm the result of the verification process within the Verification Period, the Test Chip subject to the verification process shall be deemed verified.

  • A Modified ARM7TDMI Core will be deemed compatible if the Test Chip for the Modified ARM7TDMI Core: (i) executes each and every instruction contained in the ARM Instruction Set; (ii) executes the instructions at an identical rate of clocks per instruction as the ARM7TDMI Core from which it was derived; and (iii) runs the Vectors and the AVS.

  • ARM shall provide, on reasonable notice, at ARM’s premises in Cambridge, up to four (4) weeks of support for up to two (2) LGS personnel in relation to building the Test Chip and use of the Embedded ICE.

  • The Test Chip shall be deemed accepted when the log results indicate that no errors have been detected or where any errors detected have been jointly agreed, in good faith, and a waiver agreed between the parties.

  • The parties shall repeat the above process until either: (i) the Test Chip is verified; or (ii) LGS withdraws the Test Chip from the verification process.

  • ARM shall notify LGS, in writing, within thirty (30) days of delivery by LGS of the Log Results and Test Chip samples to ARM (the “Verification Period”), whether the Test Chip has been verified or has failed the verification process.

  • Based on the delivery schedule for the layout database and schematics committed to by Rambus above, NEC will use its reasonable best efforts to complete the fabrication of a Rambus ASIC Test Chip by October 1, 1994.

  • ARM may, at ARM’s discretion, exercise the right to run the Vectors on the Test Chip.

  • If Overland fails to confirm the result of the verification process within the Verification Period, the Test Chip subject to verification will be deemed verified.


More Definitions of Test Chip

Test Chip means a prototype VR(2) Compliant Product.
Test Chip means (i); a device which complies with the test chip specification set forth in Schedule 1, Section 2, Part E, Item E1 of this Agreement for the ARM946E-S Core; and (ii) a device which complies with the test chip specification set forth in Schedule 1, Section 3, Part E, Item E1 of this Agreement for the ARM966E-S Core.
Test Chip means the semiconductor device designed by Artisan Components utilizing the optimized library created by Artisan Components as described in Section 20.1, and fabricated by IBM for purposes of verifying that such library is compliant with the Process Information.
Test Chip. A device which complies with the Test Chip Specification for the applicable CompactRISC Core identified in Exhibit B.
Test Chip means a silicon engineering prototype of the initial SyMagic Transceiver that is manufactured by or for NeoMagic.
Test Chip means a design structure database containing the IP Block that can be manufactured at Tower fabrication facility and enable characterization and validation of the IP Block.

Related to Test Chip

  • Test cycle means a sequence of test points each with a defined speed and torque to be followed by the engine under steady state (WHSC) or transient operating conditions (WHTC).

  • COVID-19 test means a viral test for SARS-CoV-2 that is:

  • DNS test Means one non-­‐recursive DNS query sent to a particular “IP address” (via UDP or TCP). If DNSSEC is offered in the queried DNS zone, for a query to be considered answered, the signatures must be positively verified against a corresponding DS record published in the parent zone or, if the parent is not signed, against a statically configured Trust Anchor. The answer to the query must contain the corresponding information from the Registry System, otherwise the query will be considered unanswered. A query with a “DNS resolution RTT” 5 times higher than the corresponding SLR, will be considered unanswered. The possible results to a DNS test are: a number in milliseconds corresponding to the “DNS resolution RTT” or, undefined/unanswered.

  • RDDS test Means one query sent to a particular “IP address” of one of the servers of one of the RDDS services. Queries shall be about existing objects in the Registry System and the responses must contain the corresponding information otherwise the query will be considered unanswered. Queries with an RTT 5 times higher than the corresponding SLR will be considered as unanswered. The possible results to an RDDS test are: a number in milliseconds corresponding to the RTT or undefined/unanswered.

  • Stand-Alone Test Environment or "SATE" shall have the meaning set forth in Section 12.2.9.3.2.