Parametric Test definition
Parametric Test means testing selected parameters of an individual device (such as an IC, whether in chip, wafer or packaged form) or of a selected group of devices, or of some aspect related to the device, in order to identify actual or potential flaws. For example, Parametric Test of scribe line test structures or process control monitor structures located on a semiconductor wafer may be used in a high-volume manufacturing process to identify process problems that may result in devices failing to pass Functional Test.